On Design for IDDQ-Based Diagnosability of CMOS Circuits Using Multiple Power Supplies

This paper presents a novel approach to improving the IDDQ-based diagnosability of a CMOS circuit by dividing the circuit into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple IDDQ measurement points, resulting in improved IDDQ-based diagnosability. The paper formalizes the problem of partitioning a circuit for this purpose and proposes optimal and heuristic based solutions. The effectiveness of the proposed approach is demonstrated through experimental results. key words: fault diagnosis, IDDQ, transistor leakage fault model, multiple power supply, circuit partitioning